Spectro Analytical Instruments has announced its new line of SPECTRO XEPOS spectrometers, for energy dispersive X-ray fluorescence (ED-XRF) technology, providing breakthrough advances in the multi-elemental analysis of major, minor, and trace element concentrations.
New developments in excitation and detection introduced with the new SPECTRO XEPOS ED-XRF spectrometers deliver outstanding sensitivity and detection limits and yield remarkable gains in precision and accuracy.
The analysers excel at critical tasks from rapid screening elemental analysis for environmental and waste sampling to demanding applications in research, academia, and geological science. They support precise product quality control at-line for a variety of applications such as chemical and petrochemical production, and the manufacture of cement, cosmetics, food, pharmaceuticals, and more.
The new line of SPECTRO XEPOS spectrometers features: enhanced sensitivity; greater precision; and faster measurements.
Redesigned operating software provides proven ease and power, while the unique new TurboQuant II software quickly and accurately analyses practically any unknown liquid, powder, or solid sample. In addition, the new SPECTRO XEPOS spectrometers exhibit a significantly lower cost of ownership than wavelength dispersive X-ray fluorescence (WD-XRF) spectrometers — thus delivering WD performance at an ED price for many applications.
Optional AMECARE M2M (machine-to-machine) support extends the new analysers’ self-diagnostic functions with proactive alerts, backed up by direct connection with a remote SPECTRO service expert’s PC.
The new line of SPECTRO XEPOS ED-XRF spectrometers is available immediately from SPECTRO Analytical Instruments. Four advanced versions are available, enabling users to prioritise their selection according to measurement speed, ultimate precision, or groups of targeted elements in specific matrices.
Edited from source by Elizabeth Corner
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